Patent · US Active

Magnetic particle imaging system and magnetic particle imaging method

US11733324B2 · kind B2 · utility

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0References
10Claims
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Key dates

Filing dateSep 24, 2021
Grant dateAug 22, 2023
Priority date
Expiry dateSep 24, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/10
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A magnetic particle imaging system includes a field free region generator and an excited magnetic field generator. The field free region generator generates a field free line with a direction of linear extension of a field free region as a direction of extension. The excited magnetic field generator generates an excited magnetic field in the field free line generated by the field free region generator. The excited magnetic field generator includes a first excited magnetic field generation unit and a second excited magnetic field generation unit. The first excited magnetic field generation unit and the second excited magnetic field generation unit are spaced from each other in the direction of extension of the field free line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.