Patent · US Active

Parametric modelling and grading

US11733853B1 · kind B1 · utility

2Cited by
2References
20Claims
0Family size

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Inventor

Key dates

Filing dateSep 28, 2022
Grant dateAug 22, 2023
Priority date
Expiry dateSep 28, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2200/24
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In some implementations, a method for custom fitting and manufacturing parametric products comprises generating a plurality of parametric 3D models of a custom product based on past learned data pertaining to the custom product; generating a first user interface comprising at least a first graphical representation of the custom product; receiving a plurality of adjustment 3D parameters for improving a fit of the custom product in relation to user-specific data; determining two particular parametric 3D models of the plurality of parametric 3D models, each having at least one 3D parameter, of the plurality of corresponding 3D parameters, that is within a particular tolerance of at least one 3D parameter of the plurality of adjustment 3D parameters; generating a parametric 3D fit model having a plurality of 3D fit model parameters by interpolating, for the at least one parameter of the two particular parametric 3D models, between a plurality of corresponding 3D control points of a first parametric 3D model and a plurality of corresponding 3D control points of a second parametric 3D model of the two particular parametric 3D models; transmitting the parametric 3D fit model to a manufact…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.