Dynamic testing of systems
US11734141B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2021 |
| Grant date | Aug 22, 2023 |
| Priority date | — |
| Expiry date | Jan 31, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects of the invention include receiving system data associated with a first system, the first system comprising a plurality of system components, wherein the system data comprises component data for each system component in the plurality of system components, obtaining historical performance data for each system component in the plurality of system components, determining at least one testing constraint associated with the first system, determining a test environment for the first system, the test environment comprising a plurality of test cases for the first system based on the system data, the historical performance data, and the at least one testing constraint, and executing the test environment on the first system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.