Patent · US Active

Enhanced SD-WAN path quality measurement and selection

US11736390B2 · kind B2 · utility

0Cited by

2References

20Claims

0Family size

Assignee

Palo Alto Networks, Inc. · US

Inventors

Chunqing Cai · Los Altos, US
Philip Kwan · San Jose, US
Lin Wang · Palo Alto, US
Lei Chang · Beijing, CN
Sameer Kumar · White Plains, US
Pulikeshi Ramanath · San Jose, US
Santosh Narayankhedkar · San Jose, US

Key dates

Filing date	Dec 7, 2021
Grant date	Aug 22, 2023
Priority date	—
Expiry date	Dec 7, 2041

Classification

Technology area (CPC H)Electricity
CPC primaryH04L43/16
WIPO fieldDigital communication
WIPO sectorElectrical engineering

Abstract

Techniques for enhanced Software-Defined Wide Area Network (SD-WAN) path quality measurement and selection are disclosed. In some embodiments, a system/method/computer program product for enhanced SD-WAN path quality measurement and selection includes periodically performing a network path measurement for each of a plurality of network paths at a Software-Defined Wide Area Network (SD-WAN) interface; updating a version if the network path measurement exceeds a threshold for one or more of the plurality of network paths; and selecting one of the plurality of network paths for a session based on the version according to an application policy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.