Post-processing of measurement data collected with optical probe
US11740063B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 25, 2022 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | May 25, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37443
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method efficiently measures an object having a feature with a plurality of profiles each having a surface. The method provides a CMM having a wrist coupled with a measuring probe. The probe has an optical probe with an angle of incidence with respect to a surface normal of a plurality of points to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method measures the feature to be measured by segment groups to obtain a 3D data set for each group. The method removes data points from at least one 3D data set that are outlier data points. The method interpolates the surface formed by the data points. The method calculates a surface normal vector for the data points set. The method removes data points from the interpolated 3D data set whose surface normal are outside the angle of incidence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.