Patent · US Active

Method for testing light-emitting unit

US11740277B2 · kind B2 · utility

0Cited by

1References

5Claims

0Family size

Assignee

DYNASCAN TECHNOLOGY CORP. · TW

Inventors

Tsun-I Wang · Taoyuan, TW
Ching-Chun Wu · Taoyuan, TW
Chia-Liang Yang · Taoyuan, TW

Key dates

Filing date	Oct 9, 2019
Grant date	Aug 29, 2023
Priority date	—
Expiry date	Jan 15, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH05B45/58
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

To test a first LED, a second LED, and a third LED in a light-emitting unit, a method is disclosed herein comprising the following steps: setting the first and second LEDs in respective driven states to generate associated light; providing the third LED to receive the light associated with the first and second LEDs, thereby generating a first photocurrent and a second photocurrent; providing the first LED to receive the light associated with the second LED, thereby generating a third photocurrent; and calculating a decay factor of each of the LEDs based on the first, second, and third photocurrents.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.