Feature selection using term frequency-inverse document frequency (TF-IDF) model
US11741236B2 · kind B2 · utility
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3References
18Claims
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Key dates
| Filing date | Jul 17, 2019 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | Dec 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2221/034
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A feature selection methodology is disclosed. In a computer-implemented method, the feature selection methodology automatically monitors components of a computing environment. The feature selection methodology then determines the importance of various components of the computing environment. The feature selection methodology further outputs results of the determining of the importance of the components within the computing device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.