Data sample label processing method and apparatus
US11741392B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2020 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | Dec 28, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/045
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are a data sample label processing method and apparatus. The data sample label processing method comprises: obtaining a first set of data samples without determined labels and a second set of data samples with determined labels; performing an iteration with the following steps until an accuracy rate meets a preset requirement: training a prediction model based on a combination of the first set of data samples and the second set of data samples; inputting data samples from the first set of data samples into the prediction model to obtain prediction values as learning labels for each data sample, and associating the learning labels with the data samples respectively; obtaining a subset from the first set of data samples, wherein the subset comprise data samples associated with learning labels; obtaining determined labels for the data samples in the subset; obtaining the accuracy rate based at least on the learning labels of the data samples in the subset and the determined labels of the data samples in the subset; and if the accuracy rate does not meet the preset requirement, labeling the data samples in the subset with the determined labels for the data samples in the subs…
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