Method and system for optical yield measurement of a standing crop in a field
US11741589B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2021 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | Oct 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30188
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An electronic data processor is configured to estimate a spatial region of interest of plant pixels of one or more target plants in the obtained image data for a harvestable plant component and its associated harvestable plant component pixels of the harvestable plant component. The electronic data processor is configured to identify the component pixels of a harvestable plant component within the obtained image data of plant pixels of the one or more target plants. An edge, boundary or outline of the component pixels is determined. The data processor is configured to detect a size of the harvestable plant component based on the determined edge, boundary or outline of the identified component pixels. A user interface is configured to provide the detected size of the harvestable plant component for the one or more target plants as an indicator of yield of the one or more plants or standing crop in the field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.