Identifying and repairing defects micro-device integrated system
US11742455B2 · kind B2 · utility
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11Claims
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Key dates
| Filing date | Nov 27, 2020 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | Mar 26, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10H20/0364
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads. Time varying signals coupled to a capacitor are used as well.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.