Patent · US Active

Method for generating a masking curve for a fill state measuring device

US11747187B2 · kind B2 · utility

0Cited by

0References

15Claims

0Family size

Assignee

Endress+Hauser SE+Co. KG · DE

Inventors

Carmen Roser · Steinen, DE
Daniel Müller · Inzlingen, DE
Florian Palatini · Raich, DE
Tanja Haag · Schopfheim, DE

Key dates

Filing date	Sep 18, 2018
Grant date	Sep 5, 2023
Priority date	—
Expiry date	Oct 31, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01S15/88
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present disclosure includes a method for creating a masking curve for an ultrasonic or radar-based fill level measuring device. A measuring signal is transmitted, a measurement curve is recorded based on the reflected measuring signal, and at least two greatest maxima are ascertained from the measurement curve. The at least two ascertained maxima are normalized with reference to the greatest maximum and one of the normalized maxima is assigned to the fill level, so that the masking curve can be created based on the measurement curve in at least one subrange between the fill level measuring device and the maximum of the fill level value. Because of the normalization of the maxima, the danger of mistake in the assignment can be lessened, so that the assignment and subsequent fill level measurements are reliable.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.