High sensitivity frequency-domain spectroscopy system
US11747204B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2021 |
| Grant date | Sep 5, 2023 |
| Priority date | — |
| Expiry date | Aug 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/4332
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system includes first and second radiation sources, first and second detectors, a signal digitizer, a controller, and an analyzer. The first and second radiation sources generate respective first and second beams of radiation to irradiate a target. The first beam and second beams each include a first wavelength operated at a first modulation frequency and a second wavelength operated at a second modulation frequency. The first and second detectors each include a photo-sensitive element that generate first or second detection signals, a Faraday shielding enclosure, a signal amplifier, and a frequency mixer to frequency-adjust the first or second detection signals. The controller provides timing information to inform an activation scheme of the first and second radiation sources and corresponding radiation detection events at the first and second detectors. The analyzer analyzes the first and second detection signals and determines at least amplitude and phase information of the scattered radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.