Dual range micro-resistivity measurement method
US11747506B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2021 |
| Grant date | Sep 5, 2023 |
| Priority date | — |
| Expiry date | Oct 20, 2041 |
Classification
- Technology area (CPC E)Fixed Constructions
- CPC primaryE21B49/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A resistivity imaging device and a method of operating the resistivity imaging device in a wellbore. The resistivity imaging device includes a first electrode, a second electrode, and a circuit electrically coupled to the first electrode and the second electrode. An impedance is measured of a formation surrounding the wellbore. Based on the impedance, the circuit is configured into one of a first circuit configuration for operating the resistivity imaging device in a first mode and a second circuit configuration for operating the resistivity imaging device in a second mode. The resistivity imaging device is operated using the circuit in the one of the first circuit configuration and the second circuit configuration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.