Sensor apparatus

US11747513B2 · kind B2 · utility

Assignees

• SICK AG · DE
• TRUMPF Werkzeugmaschinen SE + Co. KG · DE

Inventors

• Jens Ottnad · Karlsruhe, DE
• Dennis Wolf · Rutesheim, DE
• Kevin Lutz · Charlotte, US
• Christoph Blömker · Stuttgart, DE
• Michael Burger · Aliso Viejo, US
• Peter Steurer · Geislingen, DE
• Gunter Hirt · Steinach, DE
• Stefan Kienzler · Waldkirch, DE

Key dates

• Filing date: Dec 20, 2018
• Grant date: Sep 5, 2023
• Expiry date: Dec 20, 2038

Classification

• Technology area (CPC B): Performing Operations; Transporting
• CPC primary: B23Q15/007
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A sensor apparatus for detecting a target object influenced by a process or formed in the process includes a sensor unit and an evaluation device. The sensor unit detects the target object in a detection zone of the sensor unit and generates a sensor signal that can be influenced by the target object. The evaluation device processes the sensor signal as a first input variable and generates an output signal, which indicates the detection of the target object, in dependence on the sensor signal. The evaluation device further processes a process parameter of the process, which acts on the target object, or a target object parameter, which characterizes the target object and is influenced by the process, as a respective further input variable and to generate the output signal in dependence on the process parameter and/or the target object parameter.