Method for image analysis
US11748446B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 14, 2022 |
| Grant date | Sep 5, 2023 |
| Priority date | — |
| Expiry date | Apr 14, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/56
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for synthetic data generation and analysis includes generating a synthetic dataset. A set of parameters is determined and scenarios are generated from the parameters that represent three-dimensional scenes. Synthetic images are rendered for the scenarios. A synthetic dataset may be formed to have a controlled variation in attributes of synthetic images over a synthetic dataset. The synthetic dataset may be used for training or evaluating a machine learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.