Patent · US Active

Analysis and correction of supply chain design through machine learning

US11748678B2 · kind B2 · utility

0Cited by
8References
12Claims
0Family size

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Key dates

Filing dateSep 27, 2021
Grant dateSep 5, 2023
Priority date
Expiry dateSep 27, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N5/022
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and system for a machine learning duster analysis of historical lead time data, which is augmented by one or more features. The data can also be divided into groups, based on time-density of the data, with clustering performed on each group. Furthermore, clustering can also be projected onto two dimensions. In addition, the historical lead time data is separated into a plurality of tolerance zones based on tolerance criteria. The clusters are separated in accordance with a tolerance zone of each group; and further separated according to one or more lead time identifiers to provide one or more separated clusters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.