Hierarchical image decomposition for defect detection
US11748865B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2020 |
| Grant date | Sep 5, 2023 |
| Priority date | — |
| Expiry date | Mar 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspects of the present invention disclose a method, computer program product, and system for improving object detection in high-resolution images at inference time. The method includes one or more processors receiving a high-resolution image. The method further includes one or more processors decomposing the received image into hierarchically organized layers of images. Each layer comprises at least one image tile of the received image. Each of the image tiles have a corresponding resolution suitable to a baseline image recognition algorithm. The method further includes one or more processors applying the baseline algorithm to each of the image tiles of each layer. The method further includes one or more processors performing a result aggregation of results of the baseline algorithm applications to the image tiles of the layers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.