Devices, systems, and methods for controlling acquisition parameters when carrying out a medical x-ray examination

US11751825B2 · kind B2 · utility

Assignee

• Siemens Healthcare Limited · DE

Inventors

• Elizaveta Stepina · Wiesendorf, DE
• Robert Brauweiler · Baiersdorf, DE
• Philip Mewes · Nürnberg, DE

Key dates

• Filing date: Mar 24, 2020
• Grant date: Sep 12, 2023
• Expiry date: Oct 12, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G05G1/30
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

The disclosure relates to devices, systems, and methods for controlling acquisition parameters when carrying out a medical x-ray examination, wherein the device includes a lever. The lever includes a deflectably supported lever arm, which is embodied to be deflected from a rest position to a first end point, in particular a kick-down stop point, and to a second end point, by a force, in particular the force of a foot and/or the force of a hand, wherein a first value of at least one acquisition parameter of the medical x-ray examination is determined by the deflection, wherein the first value is dependent on a measure of deflection of the deflection of the lever arm from the rest position to the first end point, wherein a second value of at least one acquisition parameter of the medical x-ray examination is able to be determined by a deflection of the lever arm to the second end point, and wherein the second value is independent of the measure of deflection of the deflection of the lever arm from the rest position.