Capacitance-based foreign object debris sensor
US11752976B1 · kind B1 · utility
1Cited by
2References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2021 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Jul 16, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S2007/4977
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure relates to detecting and clearing debris from a sensor window. For instance, a system may include the sensor window and one or more processors. The sensor window may include a transparent thin film conductor. The one or more processors may be configured to identify a change in capacitance using the transparent thin film conductor, detect debris on the sensor window using the change in capacitance, and activate a cleaning system in order to clear the detected debris from the sensor window.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.