Patent · US Active

System for tear analysis of films

US11754479B2 · kind B2 · utility

0Cited by

5References

17Claims

0Family size

Assignee

DOW GLOBAL TECHNOLOGIES LLC · US

Inventors

Sanjay C. Solanki · Midland, US
Donald L. McCarty, II · Midland, US
Robert A. Gunther · Elmwood Park, US
Jin Wang · Midland, US
Kyle A. Myers · Midland, US
Scott J. Collick · Lake Jackson, US

Key dates

Filing date	Apr 30, 2018
Grant date	Sep 12, 2023
Priority date	—
Expiry date	Feb 23, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01N2203/0282
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.