Structure evaluation method and structure evaluation system
US11754530B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 2021 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Nov 19, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2698
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one embodiment, a structure evaluation system includes a wave guide, a first sensor, a second sensor, and a calculation part. The wave guide is formed in a rod shape, is inserted into a hole that is formed at a predetermined depth from a surface of a measurement target, and has one end fixed to a deepest portion of the hole. The first sensor is provided at the other end of the wave guide at a position that is substantially the same as the surface. The second sensor is provided on the surface of the measurement target. The calculation part estimates a depth of damage occurring in the measurement target from the surface on the basis of a first detection value of an elastic wave transmitted to the measurement target which is detected by the first sensor through the wave guide and a second detection value obtained by an elastic wave which is detected by the second sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.