Test site configuration in an automated test system

US11754596B2 · kind B2 · utility

Assignee

• Teradyne, Inc. · US

Inventors

• Michael O. McKenna · North Reading, US
• Christopher James Bruno · North Reading, US
• Philip Campbell · North Reading, US
• John P. Toscano · Auburn, US

Key dates

• Filing date: Oct 22, 2020
• Grant date: Sep 12, 2023
• Expiry date: Jul 22, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2891
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An example test system includes a test socket for testing a DUT, a lid for the test socket, and an actuator configured to force the lid onto the test socket and to remove the lid from the test socket. The actuator includes an upper arm to move the lid, an attachment mechanism connected to the upper arm to contact the lid, where the attachment mechanism is configured to allow the lid to float relative to the test socket to enable alignment between the lid and the test socket, and a lower arm to anchor the actuator to a board containing the test socket. The actuator is configured to move the upper arm linearly towards and away from the test socket and to rotate the upper arm towards and away from the test socket.