Testing device for electronic devices with in-band virtualized wired communications
US11754618B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 15, 2021 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Oct 15, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A testing device for testing electronic devices includes a test controller and a wireless power transmission system. The test controller is configured to generate testing signals for transmission to at least one of the plurality of electronic devices and receive testing data, in response to the testing signals. The wireless power transmission system is configured to receive the testing signal from the test controller, generate a power signal and a first asynchronous serial data signal in accordance with a wireless power and data transfer protocol, the first asynchronous serial data signal based on the testing signals, decode the power signal to extract a second data signal compliant with the wireless power and data transfer protocol, and decode the second data signal compliant with the wireless power and data transfer protocol to extract a second asynchronous serial data signal, the second asynchronous serial data signal based on the testing data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.