Wavefront tester calibration method
US11754832B1 · kind B1 · utility
1Cited by
0References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 20, 2023 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Mar 20, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/64
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A wavefront calibration method for a wavefront tester of a lens, the method including: measuring an air wavefront of the wavefront tester without the lens; measuring at least one golden sample wavefront to generate an actual wedge angle and refractive index of the at least one golden sample based on the air wavefront; calculating a measured wedge angle and refractive index based on the actual wedge angle and refractive index of the at least one golden sample; and linear fitting between the actual wedge angle and refractive index and the measured wedge angle and refractive index to produce an actual magnification of the lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.