Patent · US Active

Identifying flawed dependencies in deployed applications

US11755460B2 · kind B2 · utility

0Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 2020
Grant dateSep 12, 2023
Priority date
Expiry dateOct 31, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/245
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Flaws in dependencies of deployed applications are identified. In one embodiment, a list of dependencies used by a deployed application that is deployed on the deployment platform is obtained. Each dependency of the list of dependencies is mapped with a flaws database, wherein the flaws database comprising an indication of known flaws for different dependencies and different versions thereof. Based on such mapping, one or more flaws in the deployed application are determined. The determination is performed externally to the deployment platform and without executing a monitoring process thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.