Method and device for evaluating comment quality, and computer readable storage medium
US11756094B2 · kind B2 · utility
1Cited by
1References
15Claims
0Family size
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Key dates
| Filing date | Feb 27, 2020 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Oct 26, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/048
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present disclosure provide a method and a device for evaluating a comment quality, an electronic device, and a computer readable storage medium. The method includes: selecting a metadata key associated with a comment of an object from metadata of the object, the metadata including a plurality of key-value pairs; determining a value corresponding to the metadata key based on the metadata; and evaluating the comment quality based on the comment and the value corresponding to the metadata key.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.