Product defect detection
US11756185B2 · kind B2 · utility
1Cited by
17References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2020 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Apr 27, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention facilitate product defect detection. A computer-implemented method comprises: receiving, by a device operatively coupled to one or more processors, a template image of a normal product; generating, by the device, one or more geometric training parameters for transforming the template image; and transforming, by the device, the template image using the one or more geometric training parameters to generate a transformed image for training a data model, wherein the trained data model being used for aligning the template image and an image under inspection of a product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.