Systems and methods for splat filling a three-dimensional image using semi-measured data
US11756281B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 14, 2023 |
| Grant date | Sep 12, 2023 |
| Priority date | — |
| Expiry date | Mar 14, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are systems and methods for splat filling a three-dimensional (“3D”) model using semi-measured data. The splat filling includes generating measured data points for a 3D representation of a scene with positions that are measured from scanning the scene, and with color values defined from measured color values of used pixels from a two-dimensional (“2D”) of the scene. The splat filling includes generating a semi-measured data point based on an unused pixel of the 2D image. The position of the semi-measured data point is derived based on a separation between the unused pixel and one or more used pixels of the 2D image, and based on the positions of measured data points that are defined with the measured color values of the one or more pixels. The color values of the semi-measured data point are defined directly from the measured color values associated with the unused pixel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.