Patent · US Active

Pick and place machine cleaning system and method

US11756811B2 · kind B2 · utility

0Cited by
99References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 2, 2019
Grant dateSep 12, 2023
Priority date
Expiry dateJul 2, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6838
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A device, mechanism, and methodology for regular and consistent cleaning of the vacuum aperture, nozzle, and contacting surfaces of a pick-and-place apparatus and the pick-up tools of automated or manual semiconductor device and die handling machines are disclosed. The cleaning material may include a cleaning pad layer with one or more intermediate layers that have predetermined characteristics, regular geometrical features, and/or an irregular surface morphology.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.