Methods and apparatus to perform load measurements on hinged devices
US11761867B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 2021 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Apr 13, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0023
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example hinged device flexible substrate testing system includes: a first plate comprising a first surface configured to hold stationary a first side of a hinged device under test; a second plate comprising a second surface configured to hold a second side of the hinged device under test; a first cam follower coupled to the second plate; a first drive arm configured to move the first cam follower to cause the second plate to rotate about a hinge pivot axis of the hinged device under test; an actuator configured to rotate the drive arm; and a load cell configured to measure loads on the first plate while the actuator moves the second plate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.