Multi-wavelength LIDAR system
US11762068B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 29, 2020 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Jan 4, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02A90/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-wavelength LIDAR system includes a first laser source that generates a first optical beam having a first wavelength and a second laser source that generates a second optical beam having a second wavelength. An optical element projects the first optical beam to form a first beam profile at a target plane and projects the second optical beam to form a second beam profile at the target plane. An optical receiver generates a first wavelength signal corresponding to the received reflected portion of the first beam profile and generates a second wavelength signal corresponding to the reflected portion of the second beam profile at the target plane. A controller generates a measurement point cloud from the first and second wavelength signals, wherein an angular resolution of the measurement point cloud depends on a relative position of the first and second beam profiles at the target plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.