Patent · US Active

Event-triggered analysis for high fidelity simulation

US11762953B2 · kind B2 · utility

0Cited by

0References

19Claims

0Family size

Assignee

SAP SE · DE

Inventors

Lars Erbe · Waghäusel, DE
Andreas Wildhagen · Wiesloch, DE
Maximilian Stueber · Mannheim, DE
Andre Pany · Bad Friedrichshall, DE
Samir Zeort · Waldorf, DE
Pablo Vicente Albert-Maestro · Trondheim, NO

Key dates

Filing date	Dec 4, 2018
Grant date	Sep 19, 2023
Priority date	—
Expiry date	May 22, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG06F2119/12
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Systems and methods for event-triggered analysis for high fidelity simulation. The method may comprise collecting event data produced by one or more event monitors in operational relationship with one or more elements of an event-producing system, wherein at least one of the one or more elements generates a plurality of events. The event data may be clustered into one or more groups, according to one or more event attributes. The event data may be selectively transmittable to one or more subscribers, by way of the one or more subscribers subscribing to one or more channels associated with the one or more groups. A publication mechanism may be implemented to classify the clustered event data into the one or more channels, the event data associated with at least one attribute being classified for transmission over at least one of the one or more channels.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.