Apparatus and method for abnormal situation detection
US11763179B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 7, 2020 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Jun 30, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for abnormal situation detection are disclosed. An abnormal situation detection apparatus can map first sensor data among sensor data transmitted from a plurality of sensors into a vector value, convert it into first situation information in the form of an image pattern, and generate a learning model using the first situation information and an abnormal situation reference range. In addition, the abnormal situation detection apparatus can convert second sensor data among sensor data transmitted from a plurality of sensors into a form that can be input to the learning model, and determine whether an abnormal situation occurs by applying the converted second data to the learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.