Dynamically applying machine learning models from profiling received data
US11763196B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2020 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Jan 23, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems and computer readable media are provided for configuring machine learning systems to automatically and dynamically select a machine learning model based on statistical profiling of received data to improve machine learning applications for high variance data. Data is received from a system in operation. A profile is computed for the received data. A database comprising a plurality of stored profiles for a dataset is accessed, wherein each stored profile corresponds to a distinct pattern identified in the dataset. The computed profile is compared to each of the stored profiles to determine whether the computed profile matches one or more of the stored profiles. When one or more stored profiles match the computed profile, a matching profile is selected by the machine learning system. The received data is processed using a ML model associated with the matching profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.