Devices, systems, and methods for image stitching
US11763424B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 4, 2020 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Nov 30, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20212
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for image stitching is provided. The method may include obtaining a reference image of a first portion of a subject and a target image of a second portion of the subject, and determining at least one pair of feature points based on a preliminary registration accuracy. The first and second portions may at least partially overlap with each other. Each pair may include a reference feature point in the reference image and a target feature point in the target image that matches the reference feature point. For each pair, the method may further include determining an updated pair of feature points based on a superior registration accuracy higher than the preliminary registration accuracy and a neighboring region of the target feature point of the pair. The method may further include generating a stitched image based on the at least one updated pair.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.