Method and apparatus for training cell defect detection model
US11763549B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2023 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Apr 27, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for training a cell defect detection model includes training a defect classification model that includes an output layer using a plurality of first sample images so that a defect classification model obtained through training is capable of predicting a plurality of first-preset-category defects of a cell, inputting a second sample image to a defect classification model with at least an output layer removed to obtain a sample feature vector of the second sample image, inputting the sample feature vector of the second sample image to a backbone model to obtain a predicted defect classification result of the second sample image, and adjusting, based on a second-preset-category defect and the predicted defect classification result of the second sample image, parameters of the backbone model and the defect classification model with at least the output layer removed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.