Conformance testing method and apparatus, and storage medium
US11764871B2 · kind B2 · utility
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5References
20Claims
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Key dates
| Filing date | Mar 30, 2022 |
| Grant date | Sep 19, 2023 |
| Priority date | — |
| Expiry date | Mar 30, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/03012
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A conformance testing method including: obtaining a testing symbol pattern in an optical signal; performing equalization compensation on the testing symbol pattern; generating a testing eye pattern; calculating a value of a first parameter based on the testing eye pattern and a noise enhancement coefficient, where the first parameter is used to determine a transmitter dispersion eye pattern closure degree of the optical transmitter; and when the value of the first parameter is less than or equal to a preset threshold, determining that conformance testing on the optical signal succeeds.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.