Patent · US Active

Scanning path segmentation of workpiece

US11774226B2 · kind B2 · utility

0Cited by
7References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 25, 2022
Grant dateOct 3, 2023
Priority date
Expiry dateMay 25, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/37443
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method efficiently measures an object having a feature. The feature has a plurality of cross-sections that each have a surface. The method provides a coordinate measuring machine having a discretely indexable wrist coupled with a measuring probe. The wrist has a given wrist orientation, relative to an arm of the coordinate measuring machine, that is adjustable between a plurality of different orientations. The probe is able to measure different surfaces as a function of the different wrist orientations. The method segments an object to be measured into a plurality of segments that are each measurable with a given wrist orientation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.