Particle measuring device, calibration method, and measuring device
US11774340B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 30, 2019 |
| Grant date | Oct 3, 2023 |
| Priority date | — |
| Expiry date | Oct 16, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
For an easy calibration using calibration particles, provided is a measuring device to capture images of target objects. An image analyzer acquires multiple images obtained at a predetermined time interval, (a) specifies the mean-square displacement of a bright point of a calibration particle based on the displacement of the bright point of the calibration particle in the multiple images in a calibration mode, and (b) specifies the mean-square displacement of a bright point of the target particle based on the displacement of the bright point of the target particle in the multiple images in a measurement mode. A particle size analyzer (c) derives the particle size of the target particle from the mean-square displacement of the bright point of the target particle based on the mean-square displacement of the bright point of the calibration particle and the particle size of the calibration particle in an analysis mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.