Method for determining relative degrees of reflectance of a measurement surface

US11774360B2 · kind B2 · utility

Assignee

• Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

• Gregor Bern · Glückstadt, DE
• Peter Schöttl · Freiburg (Elbe), DE
• Anna Heimsath · Freiburg (Elbe), DE
• Peter Nitz · Gundelfingen, DE

Key dates

• Filing date: Sep 30, 2019
• Grant date: Oct 3, 2023
• Expiry date: Sep 3, 2040

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02E10/47
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for determining relative degrees of reflectance of a measurement surface, having the method steps of applying measurement radiation to the measurement surface, such that a measurement spot is produced on the management surface, moving the measurement spot along at least a first straight measurement spot path, over the measurement surface in accordance with a first path movement and along a second straight measurement spot path with a second path movement, recording a first and second image sets of a plurality of locally resolved images of the measurement surface during the first path movement and the second path movement. An evaluation is carried out at intersection points, whose location points on the management surface are defined by evaluation lines, wherein a first group of straight evaluation lines within the first measurement path region and a second group of straight evaluation lines within the second measurement path region are predefined and/or determined. The evaluation lines of the first group are parallel to the first measurement spot path and the evaluation lines of the second group are parallel to the second measurement spot path, and each first group evaluat…