Over the air measurements meeting a gain flatness criterion
US11774483B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 29, 2020 |
| Grant date | Oct 3, 2023 |
| Priority date | — |
| Expiry date | May 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/308
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring performance of at least one DUT in a reverberation chamber over a frequency band, the method including, iteratively: generating a fading scenario by the reverberation chamber; identifying at least one measurement sub-band included in the frequency band, wherein the at least one measurement sub-band complies with a gain flatness criterion; measuring performance of the at least one DUT in the at least one identified measurement sub-band, thereby generating at least one performance measurement result; accumulating the at least one performance measurement result; and determining measurement coverage and terminating the performance measurement in case the measurement coverage meets a coverage criterion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.