Sensor system and method for measuring a process value of a physical system
US11774926B2 · kind B2 · utility
Assignees
Inventor
Key dates
| Filing date | Sep 17, 2021 |
| Grant date | Oct 3, 2023 |
| Priority date | — |
| Expiry date | Dec 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0254
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
The present disclosure describes a sensor system for measuring a process value of a physical system, including: a plurality of sensors, wherein each sensor is configured to generate a sense signal as a function of the process value at a given time; a system state corrector configured to determine an actual system state of the physical system at a given state update cycle; a system state predictor configured to determine a predicted system state of the physical system at a given prediction cycle from a previous system state at a previous state update cycle; a sense signal predictor configured to determine predicted sense signals at the given prediction cycle from the predicted system state by applying a first operation to the predicted system state using a sense signal model of the physical system for predicting the sense signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.