Hysteresis effect-based field free point-magnetic particle imaging method
US11779237B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 30, 2022 |
| Grant date | Oct 10, 2023 |
| Priority date | — |
| Expiry date | May 30, 2042 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02A90/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A hysteresis effect-based Field Free Point-Magnetic Particle Imaging (FFP-MPI) method includes the following steps: acquiring a hysteresis loop model of Superparamagnetic Iron Oxide Nanoparticles (SPIOs); calculating to obtain a Point Spread Function (PSF) of the SPIOs on the basis of a sinusoidal excitation magnetic field and the hysteresis loop model of the SPIOs; acquiring an original reconstructed image of FFP-MPI on the basis an FFP moving track and a voltage signal; performing deconvolution on the original image with respect to the PSF considering an hysteresis effect, so as to obtain a final reconstructed image; the artifacts and phase errors of image reconstruction caused by the hysteresis effect of the SPIOs with large particle sizes are reduced, the deficiency in reconstruction by the traditional reconstruction method that ignores the hysteresis effect is overcome, the reconstruction speed and the resolution are greatly improved, and the application range of the SPIOs is expanded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.