Patent · US Active

Polishing composition and polishing method

US11781039B2 · kind B2 · utility

0Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2017
Grant dateOct 10, 2023
Priority date
Expiry dateDec 22, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Solutions are disclosed for preventing the settling of an abrasive, while maintaining the polishing performance of a polishing composition. Solutions are disclosed for improving the redispersibility of an abrasive while maintaining the polishing performance. Polishing compositions for use in polishing a semiconductor substrate according to the present disclosure include an abrasive, a layered compound, and a dispersion medium.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.