In-contact continuous temperature measurement probe for non-insulated electric-current carrying conductor
US11781921B2 · kind B2 · utility
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10Claims
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Key dates
| Filing date | Oct 29, 2020 |
| Grant date | Oct 10, 2023 |
| Priority date | — |
| Expiry date | Aug 28, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N10/17
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An in-contact temperature measurement probe, which can measure temperature accurately on the surface of a current carrying wire, rod, heater, or other device, while maintaining the safety of the user via employing non-electrically conductive but thermally conductive materials.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.