Observable micro-nano mechanical testing apparatus and method
US11781956B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2021 |
| Grant date | Oct 10, 2023 |
| Priority date | — |
| Expiry date | Feb 9, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0647
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An observable micro-nano mechanical testing apparatus and an observable micro-nano mechanical testing method are provided. The apparatus includes a supporting component, a driving component, a bearing component and an imaging component. The driving component and the imaging component are respectively vertically arranged on the supporting component, the bearing component is horizontally arranged on the supporting component and positioned below the driving component and the imaging component, the bearing component is used for bearing a sample and moving the sample, the driving component is used for driving an indenter to apply loads on the sample so as to form an indentation on the sample, and the imaging component is used for observing and analyzing the indentation on the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.