Aiding diagnosis of errors in code
US11782817B2 · kind B2 · utility
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15Claims
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Key dates
| Filing date | Sep 20, 2021 |
| Grant date | Oct 10, 2023 |
| Priority date | — |
| Expiry date | Sep 20, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3636
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aiding diagnosis of errors in code based on a stack trace. Identifying target diagnostic information sources relevant to an obtained stack trace improves the efficiency and accuracy of the process of finding information for diagnosis of errors. This is achieved by analyzing the stack trace to identify stack trace elements and comparing the identified stack elements with diagnostic stack elements corresponding to diagnostic information sources from a database of diagnostic information sources.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.