On-chip testing architecture for display system
US11783739B2 · kind B2 · utility
1Cited by
11References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 9, 2021 |
| Grant date | Oct 10, 2023 |
| Priority date | — |
| Expiry date | Aug 9, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.