Patent · US Active

Terahertz spectrum measurement system and method for analyzing a terahertz spectrum of a substance

US11788956B2 · kind B2 · utility

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9Claims
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Key dates

Filing dateSep 30, 2019
Grant dateOct 17, 2023
Priority date
Expiry dateJan 22, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S2302/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present application provides a terahertz spectrum measurement system and a method for analyzing a terahertz spectrum of a substance, wherein the terahertz spectrum measurement system comprises: two terahertz quantum cascade lasers with their emission ports arranged oppositely; and a vacuum hood arranged between the emission ports of two terahertz quantum cascade lasers. The terahertz spectrum measurement system and the method for analyzing a terahertz spectrum of a substance realize a separate terahertz dual frequency comb while retaining the advantages of the on-chip dual frequency comb system, which solves the problem that the on-chip dual frequency comb cannot directly measure the terahertz spectra of substances.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.