Measurement system and method of operating a measurement system
US11789040B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2021 |
| Grant date | Oct 17, 2023 |
| Priority date | — |
| Expiry date | Jan 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system including a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner. The measurement device includes a control circuit. The first probe unit includes an interface module being configured to receive a user input, to generate an input data signal based on the received user input, and to provide the input data signal to the control circuit. The control circuit is configured to generate and provide a control signal at least to the second probe unit based on the input data signal. At least the second probe unit is configured to adjust an operational parameter based on the control signal, wherein the operational parameter relates to a measurement parameter to be measured Moreover, a method for operating a measurement system is disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.